List of EPIC fits images true List of EPIC imaging event lists true Attitude file true Lower pi bin range pimin in [0:20000] Higher pi bin range pimax in [0:20000] Create new exposure maps? eboxdetect, emldetect: Lower detection likelihood threshold likemin in [0.0:1.E10] eboxdetect, emldetect: Energy conversion factors ecf in [0.:1000.] eexpmap: Positional accuracy of attitude rebinning [arcsec] eex_attrebin in [0.0:60.0] emask: Threshold parameter 1: fraction of maximum exposure emask_threshold1 in [0.0:1.0] emask: Threshold parameter 2: threshold for gradient of exposure emask_threshold2 in [0.0:10.0] eboxdetect: Name of local mode source list true eboxdetect: Name of map mode source list true eboxdetect: Local mode minimum detection likelihood eboxl_likemin in [1.0:50.0] eboxdetect: Map mode minimum detection likelihood eboxm_likemin in [1.0:50.0] eboxdetect: Detection mask flag eboxdetect: Exposure image flag eboxdetect: Detection box size: permitted values: 3 or 5 ebox_boxsize in [3:5] esplinemap: Flag to use detection mask esplinemap: Number of spline nodes esp_nsplinenodes in [5:20] esplinemap: Number of iterations esp_nfitrun in [1:5] esplinemap: Source cut-out flux level, [counts/arcsec^2] esp_scut in [0.0:10.0] esplinemap: Threshold for excess with respect to spline esp_excesssigma in [1.0:6.0] esplinemap: Flag to use exposure map esplinemap: Flag to use exposure map esplinemap: Flag to use out-of-time event set esplinemap: EPN out-of-time event set true esplinemap: Flag to write cheesed image esplinemap: Method for background fitting [spline|model] emldetect: Name of source list true emldetect: Event cut-out radius (if .lt. 1.0: fraction of encircled energy, else pixels) eml_ecut in [0.4:100.] emldetect: Source cut-out radius for multi-source fits (if .lt. 1.0: fraction of encircled energy, else pixels) eml_scut in [0.4:100.] emldetect: Fit source extent emldetect: Allow fitted count rates to become negative emldetect: Determine statistical errors emldetect: Maximum number of sources to be fit simultaneously in multi-source fits eml_nmaxfit in [1:6] emldetect: Maximum number of emldetect sources per input source position eml_nmulsou in [1:3] emldetect: Creation of output source map emldetect: Use detector masks emldetect: Model function for source extent emldetect: Extent likelihood threshold eml_dmlextmin in [0.0:100.0] emldetect: Maximum value of source extent [in units of image pixels] eml_maxextent in [0.1:300.0] emldetect: Use two stage process for multi PSF (eml_nmulsou > 1) fitting emldetect: Use likelihood/brightness threshold for multi-PSF fitting emldetect: Threshold above which multi-PSF fitting is used eml_threshold in [0.0:1.E10] emldetect: Input list column to apply threshold [LIKE|RATE|SCTS] emldetect: Model PSF - fully 2d parametrized analytical EPIC PSFs or medium accuracy PSF eboxdetect, emldetect: Allow user-defined values of imagebuffersize eboxdetect, emldetect: Controls memory requirements for raster scan data. imagebuffersize in [100:10000] esensmap: Upper limit likelihood esen_mlmin in [0.0:1.E10]